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Nova Measuring Instruments Ltd.
develops, produces and markets metrology systems for process control that are integrated into process equipment tools, or used as stand-alone metrology platforms for the global semiconductor manufacturing industry.
Nova Announces 2008 Second Quarter Results
Nova Schedules 2008 Second Quarter Results Conference Call for August 5, 2008 at 11:00 am ET
Nova Pushes Optical CD Boundaries with Nova T500™ Stand-Alone Platform
The Nova T500 features 250WPH throughput and 30% improvement in precision
Nova Sets an Industry Milestone for Optical CD Metrology
Demonstrated less than 1 second measurement time
Nova Celebrates Installation of 100th Metrology System in South Korea
Market-leading technology widely accepted with more than 650 300mm systems installed worldwide
Semicon West 2008
Come and visit us in San Francisco.
A Novel Method for Line Edge Roughness Detection
Presented by Nova & Technion - the Israel Institute of Technology
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